NSN 6650-01-083-6671 NIIN 010836671 — Optical Microscope

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NSN

Item Name

Assigned

DEMIL

Shelf Life

UOM

Using Services

NSN:

		6650-01-083-6671
6650010836671

Description:

MICROSCOPE,OPTICAL

NSN Assigned:

28-SEP-79

DEMIL:

DEMIL

Shelf Life:

N/A

UOM:

Using Services:

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Quality Commitment

Serving our customers with quality and safety first.

AS9120 Certified
Audited supply chain
ITAR Registered
DDTC Registered
HAZMAT Certified
Customer service objectives
Every product 100% inspected

6650-01-083-6671 Specification Set by the OEM (see RNCC code 3)

Diameter ABMZ:

120.0 mm

Carrying Case AFJU:

provided

Accessory Components And Quantity AKYD:

dust cover 1; centering mount 1; research illuminator 1; green filter 1; blue filter 1; bulb 1

Usage Design ALBY:

biology and chemistry

Lens Type BLGP:

achromatic and achromatic and achromatic and achromatic

Magnification BLPR:

4.0x and 10.0x and 40.0x and 60.0x

Nonstereoscopic Type BMLT:

monocular

Body Tube Position BMLW:

inclined and vertical

Body Tube Interchangeability Feature BMLZ:

not provided

Body Tube Analyzer BMMB:

included

Body Tube Bertrand Lens BMMC:

provided

Body Tube Accessroy Slot BMMD:

provided

Stage Shape BMMF:

circular

Stage Type BMMH:

mechanical and revolving

Mounted Cross Hairs BMSR:

not provided and provided

Lens Coating Feature BMSX:

coated and coated and coated and coated

Numeric Aperture BMTB:

0.10 and 0.25 and 0.65 and 0.80

Stage Calibration Facility BPFB:

graduated scale

Substage Condenser Design BPFC:

achromatic

Condenser Adjustability BPFD:

adjustable

Iris Diaphragm Type BPFF:

centerable

Polarizer BPFG:

provided

Mirror Quantity BPFH:

Mirror Surface Contour BPFJ:

PLANO-Concave

Nosepiece Design BPFK:

turret

Nosepiece Place Quantity BPFL:

Objective Quantity BPFM:

1 and 1 and 1 and 1

Mounted Micrometer Scale BPFR:

provided and not provided

Eyepiece Quantity BPFW:

1 and 1

Eyepiece Magnification BPFY:

5 and 10

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number

Cage

RNCC

RNVC

DAC

RNAAC

Status

MSDS

SADC

Part Number:

15164

Cage Code:

06877

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

MPS-3

Cage Code:

06877

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

09176

FIIG:

T271-C

Concept No.:

App. Key:

Cond. Code:

Status:

Definition Definition of approved item name (AIN): "MICROSCOPE,OPTICAL"

An optical instrument used as an assistance to the eye or camera in viewing or photographing minute close objects. The essential parts of a microscope comprise an optical system consisting of separate objective and ocular lens assemblies which provide greater magnifications than can be obtained with a single lens assembly. Excludes magnifier.

6650-01-083-6671 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC

PMIC

ESD

ENAC

ADPE

CRITL

HMIC:

PMIC:

ESD:

ADPE:

CRITL:

Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) U

Precious metal content is unknown

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.