NSN 6650-00-422-2958 NIIN 004222958 — Optical Microscope

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NSN

Item Name

Assigned

DEMIL

Shelf Life

UOM

Using Services

NSN:

		6650-00-422-2958
6650004222958

Description:

MICROSCOPE,OPTICAL

NSN Assigned:

24-JUL-70

DEMIL:

Shelf Life:

N/A

UOM:

Using Services:

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Quality Commitment

Serving our customers with quality and safety first.

AS9120 Certified
Audited supply chain
ITAR Registered
DDTC Registered
HAZMAT Certified
Customer service objectives
Every product 100% inspected

6650-00-422-2958 Specification Set by the OEM (see RNCC code 3)

Carrying Case AFJU:

not provided

Usage Design ALBY:

any acceptable

Design Type APGF:

general purpose

Focusing Type BCTD:

adjustable

Lens Type BLGP:

achromatic

Magnification BLPR:

4.0x and 10.0x and 40.0x and 100.0x

Nonstereoscopic Type BMLT:

binocular

Body Tube Position BMLW:

inclined

Body Tube Interchangeability Feature BMLZ:

provided

Body Tube Analyzer BMMB:

not included

Body Tube Bertrand Lens BMMC:

not provided

Body Tube Accessroy Slot BMMD:

not provided

Stage Shape BMMF:

rectangular

Stage Material BMMG:

metal

Stage Type BMMH:

mechanical

Centering Feature BMMJ:

provided

Mounted Cross Hairs BMSR:

not provided

Disc Insert Usage Design BMST:

not provided

Lens Coating Feature BMSX:

coated

Cover Glass Correction Collar BMSZ:

not provided

Numeric Aperture BMTB:

1.30

Objective Type BMTH:

dry and dry and dry and oil immersion

Stage Calibration Facility BPFB:

graduated scale

Substage Condenser Design BPFC:

abbe

Condenser Adjustability BPFD:

adjustable

Iris Diaphragm Type BPFF:

centerable

Polarizer BPFG:

not provided

Nosepiece Design BPFK:

turret

Nosepiece Place Quantity BPFL:

Objective Quantity BPFM:

1 and 1 and 1 and 1

Funnel Stop Design Feature BPFP:

not provided and not provided and not provided and provided

Objective Iris Diaphragm BPFQ:

provided

Mounted Micrometer Scale BPFR:

not provided

Eyepiece Quantity BPFW:

Eyepiece Designator BPFX:

wide field

Eyepiece Magnification BPFY:

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number

Cage

RNCC

RNVC

DAC

RNAAC

Status

MSDS

SADC

Part Number:

PB252

Cage Code:

06175

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

09176

FIIG:

T271-C

Concept No.:

App. Key:

Cond. Code:

Status:

Definition Definition of approved item name (AIN): "MICROSCOPE,OPTICAL"

An optical instrument used as an assistance to the eye or camera in viewing or photographing minute close objects. The essential parts of a microscope comprise an optical system consisting of separate objective and ocular lens assemblies which provide greater magnifications than can be obtained with a single lens assembly. Excludes magnifier.

6650-00-422-2958 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC

PMIC

ESD

ENAC

ADPE

CRITL

HMIC:

PMIC:

ESD:

ADPE:

CRITL:

Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.