NSN 6650-00-296-3329 NIIN 002963329 — Optical Microscope

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NSN

Item Name

Assigned

DEMIL

Shelf Life

UOM

Using Services

NSN:

		6650-00-296-3329
6650002963329

Description:

MICROSCOPE,OPTICAL

NSN Assigned:

28-SEP-73

DEMIL:

DEMIL

Shelf Life:

N/A

UOM:

1 EA

Using Services:

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Quality Commitment

Serving our customers with quality and safety first.

AS9120 Certified
Audited supply chain
ITAR Registered
DDTC Registered
HAZMAT Certified
Customer service objectives
Every product 100% inspected

6650-00-296-3329 Specification Set by the OEM (see RNCC code 3)

Carrying Case AFJU:

provided

Usage Design ALBY:

chemistry

Design Type APGF:

research model

Focusing Type BCTD:

adjustable

Lens Type BLGP:

achromatic

Magnification BLPR:

4.0x and 10.0x and 21.0x

Nonstereoscopic Type BMLT:

monocular

Body Tube Position BMLW:

vertical

Adjustable Drawtube Calculation Method BMLX:

single calibration

Body Tube Interchangeability Feature BMLZ:

not provided

Body Tube Analyzer BMMB:

not included

Body Tube Bertrand Lens BMMC:

not provided

Body Tube Accessroy Slot BMMD:

not provided

Stage Shape BMMF:

circular

Stage Type BMMH:

revolving

Centering Feature BMMJ:

provided

Mounted Cross Hairs BMSR:

provided

Disc Insert Usage Design BMST:

not provided

Lens Coating Feature BMSX:

uncoated

Cover Glass Correction Collar BMSZ:

not provided

Numeric Aperture BMTB:

0.08 and 1.25

Objective Type BMTH:

dry

Stage Calibration Facility BPFB:

graduated periphery

Substage Condenser Design BPFC:

variable focus

Condenser Adjustability BPFD:

adjustable

Iris Diaphragm Type BPFF:

noncenterable

Polarizer BPFG:

provided

Mirror Quantity BPFH:

Mirror Surface Contour BPFJ:

PLANO-Concave

Nosepiece Design BPFK:

sliding

Nosepiece Place Quantity BPFL:

Objective Quantity BPFM:

Funnel Stop Design Feature BPFP:

not provided

Objective Iris Diaphragm BPFQ:

provided

Mounted Micrometer Scale BPFR:

provided

Eyepiece Quantity BPFW:

Eyepiece Designator BPFX:

huygenian

Eyepiece Magnification BPFY:

5 and 10 and 25

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number

Cage

RNCC

RNVC

DAC

RNAAC

Status

MSDS

SADC

Part Number:

31-28-65-04

Cage Code:

06175

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

09176

FIIG:

T271-C

Concept No.:

App. Key:

Cond. Code:

Status:

Definition Definition of approved item name (AIN): "MICROSCOPE,OPTICAL"

An optical instrument used as an assistance to the eye or camera in viewing or photographing minute close objects. The essential parts of a microscope comprise an optical system consisting of separate objective and ocular lens assemblies which provide greater magnifications than can be obtained with a single lens assembly. Excludes magnifier.

6650-00-296-3329 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC

PMIC

ESD

ENAC

ADPE

CRITL

HMIC:

PMIC:

ESD:

ADPE:

CRITL:

Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.

Material Management Material categorization and source of supply

SOS

SMIC

MMAC

MCC

SOS:

FLZ

SOS:

MMAC:

MCC:

Source of Supply (SOS) FLZ

Warner-robins air logistics center 455 byron st robins afb, ga 31098-1860

Material Management (MMAC) RN

Ground support equipment

Material Codes

SOS: Source of Supply. A three position code or routing identifier code (ric), which identifies the source of supply activity.

SMIC: Special Material Indicator Code. A two position code, which categorizes material on the basis of requirements for source or quality control, technical design or configuration control, procurement, stocking and issue control, special receipt, inspection, testing, storage, or handling.

MMAC: Material Management Aggregation Code. A two position code that identifies an item of supply to be managed by a specific activity manager.

MCC: Material Echelon Code. A two position code employed by the marine corps in classifying items into categories by materiel category and procurement echelon. the alphanumeric management code is in the first position and identifies the materiel category

IMC: Denotes wether items shall be subjected to integrated management under the defense supply agency or retained by the individual military service or other department of defense components for their management. Assigned by th activity responsible for item management coding.