NSN 6625-01-604-1533 NIIN 016041533 — Electronic Circuit Plug Test Set

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
6625-01-604-1533
6625016041533
Description:
TEST SET,ELECTRONIC CIRCUIT PLUG
NSN Assigned:
28-MAR-12
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Part Number:
Quantity Requested:
Your Email:
Full Name:
Contact Phone:
Company:

Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

6625-01-604-1533 Specification Set by the OEM (see RNCC code 3)

Width ABGL:

9.5in.

Length ABRY:

6.5in.

Ac Voltage Rating ACYN:

100.0 volts and 250.0 volts 1st operating power rqmt

Frequency Rating ACZB:

47.0 hertz and 63.0 hertz 1st operating power rqmt

End Item Identification AGAV:

memory tester for DDR3 and DDR2 usb interfac

Electrical Power Source Relationship AKWC:

operating

Internal Battery Accommodation ALSF:

not included 1st operating power rqmt

Inclosure Feature ANPZ:

single item w/carrying case

Test Type For Which Designed AQXY:

registered, unbuggered, ecc and NON-Ecc parity memory devices

Part Name Assigned By Controlling Agency CXCY:

ramcheck lx

Special Features FEAT:

op temp: 3 deg to 32 deg c

Height HGTH:

3.0in.

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
RAMCHECK LX DDR3/2
Cage Code:
0VGX1
RNCC:
3
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
61200
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
2
Status:
A

Definition Definition of approved item name (AIN): "TEST SET,ELECTRONIC CIRCUIT PLUG"

A test set specifically designed for use in making examination of plug-in items, commonly referred to as modules or potted components, that are part of an electronic equipment. These plug-in items are inclosed and sealed in a case, and are provided with plug-type connectors for insertion into or removal from the component or equipment of which they are a part. It includes items that test circuit cards, that may or may not be encased and/or sealed, used with electronic computers. Excludes test set (1), electron tube and test set, vibrator.

6625-01-604-1533 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
ADPE:
0
CRITL:
X
Hazmat (HMIC) P

Indicates there is no information in the hmirs. The nsn is in a fsc in table ii of fed std 313 and a msds may be required by the user. The requirement for a msds is dependent on a hazard determination of the supplier or the intended end use of item.

Precious Metals (PMIC) A

Item does not contain precious metal.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.