NSN 6625-01-460-7146 NIIN 014607146 — Semiconductor Device Test Set

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NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
6625-01-460-7146
6625014607146
Description:
TEST SET,SEMICONDUCTOR DEVICE
NSN Assigned:
13-NOV-98
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

6625-01-460-7146 Specification Set by the OEM (see RNCC code 3)

Width ABGL:

11.450in.

Ac Voltage Rating ACYN:

100.0 volts and 230.0 volts

Frequency Rating ACZB:

60.0 hertz

Major Components AEAS:

TR210; instruction manual; one set ATL25 test probes; common test leads; two MINI-Clip leads; u.s. power cord

Depth AEJZ:

10.200in.

End Item Identification AGAV:

used with TDS210 or tds 220 digital real time oscilloscopes

Electrical Power Source Relationship AKWC:

operating

Inclosure Feature ANPZ:

single item w/housing

Test Type For Which Designed AQXY:

current voltage analog signature

Operating Test Capability AQXZ:

test frequency 50 hz or 60 hz, 200 hz, 2, 000 hz; pulse generator 0 v TO5 v

Phase FAAZ:

two

Special Features FEAT:

BUILT-In pulse generator

Functional Description FTLD:

provides advanced troubleshooting capabilities to simplify testing of cmos and mos circuits; troubleshoots GATE-Fired scrs, triacs, and OPTO-Couplers

Height HGTH:

2.450in.

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
TR210
Cage Code:
57705
RNCC:
3
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:
Part Number:
TR210
Cage Code:
80009
RNCC:
5
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:
Part Number:
TR210
Cage Code:
FA0Q5
RNCC:
5
RNVC:
2
DAC:
4
RNAAC:
ZF
Status:
A
MSDS:
SADC:
Part Number:
298-2320
Cage Code:
FA0Q5
RNCC:
5
RNVC:
2
DAC:
4
RNAAC:
ZF
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "TEST SET,SEMICONDUCTOR DEVICE"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

6625-01-460-7146 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
ADPE:
0
CRITL:
X
Hazmat (HMIC) P

Indicates there is no information in the hmirs. The nsn is in a fsc in table ii of fed std 313 and a msds may be required by the user. The requirement for a msds is dependent on a hazard determination of the supplier or the intended end use of item.

Precious Metals (PMIC) A

Item does not contain precious metal.

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.