NSN 6625-00-923-6534 NIIN 009236534 — Semiconductor Device Test Set

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
6625-00-923-6534
6625009236534
Description:
TEST SET,SEMICONDUCTOR DEVICE
NSN Assigned:
11-DEC-65
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

6625-00-923-6534 Specification Set by the OEM (see RNCC code 3)

Width ABGL:

6.000in.

Length ABRY:

8.187in.

Internal Battery Accommodation ALSF:

included

Inclosure Feature ANPZ:

single item w/carrying case

Test Type For Which Designed AQXY:

front resistance of crystal; back resistance of crystal; back current of crystal

Operating Test Capability AQXZ:

front RESISTANCE-Not greater than 0.5 kilohm for a good crystal; back RESISTANCE-Ratio of back to front resistance greater than 10 to 1 for a good crystal; back CURRENT-Crystal should not indicate current greater than - crystal IN21 and IN23, IN23A, IN25, IN21A and IN23B, IN21B, IN26 we, IN26 syl, IN78 syl - current d. c. 0.400 ma, 0.300 ma, 0.250 ma, 0.175 ma, 0.125 ma, 0.110 ma, 0.230 ma, 0.160 ma

Height HGTH:

3.625in.

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
TS268EU
Cage Code:
94518
RNCC:
3
RNVC:
2
DAC:
2
RNAAC:
ZG
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "TEST SET,SEMICONDUCTOR DEVICE"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

6625-00-923-6534 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
ADPE:
CRITL:
X
Hazmat (HMIC) P

Indicates there is no information in the hmirs. The nsn is in a fsc in table ii of fed std 313 and a msds may be required by the user. The requirement for a msds is dependent on a hazard determination of the supplier or the intended end use of item.

Precious Metals (PMIC) U

Precious metal content is unknown

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.