NSN 5961-01-579-0694 NIIN 015790694 — Semiconductor Device Assembly

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-01-579-0694
5961015790694
Description:
SEMICONDUCTOR DEVICE ASSEMBLY
NSN Assigned:
29-OCT-09
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
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  •   HAZMAT Certified
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  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-01-579-0694 Specification Set by the OEM (see RNCC code 3)

End Item Identification AGAV:

tension regulator

Part Name Assigned By Controlling Agency CXCY:

precision micropower shunt voltage reference

Special Features FEAT:

tolerates capacitive loads, low output noise

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
LM4040AIM3-2.5 ROHS
Cage Code:
27014
RNCC:
3
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:
Part Number:
91765028
Cage Code:
F6481
RNCC:
5
RNVC:
2
DAC:
4
RNAAC:
ZF
Status:
A
MSDS:
SADC:
Part Number:
10383367
Cage Code:
A486G
RNCC:
6
RNVC:
9
DAC:
9
RNAAC:
WF
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
35565
FIIG:
T01200
Concept No.:
App. Key:
C
Cond. Code:
2
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE ASSEMBLY"

A grouping of two or more semiconducting devices such as light emitting diode; semiconductor device, diode; semiconductor device, photo; semiconductor device, thyristor; and/or transistor mounted on a common mounting or mounted on each other. The devices must be separable and each item must be capable of functioning in accordance with its given name. For assemblies consisting of semiconducting devices permanently cased, encapsulated, or potted together to form a single unit, see rectifier, semiconductor device, unitized and semiconductor devices, unitized. Excludes semiconductor device set; microcircuit assembly; and microcircuit set. See also absorber, overvoltage.

5961-01-579-0694 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
A
ESD:
A
ESD:
A
ADPE:
0
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.