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plastic all semiconductor device diode
2.000in. all semiconductor device diode ⁓2-1/64"
0.400in. all semiconductor device diode
0.275in. all semiconductor device diode
matched
2 semiconductor device diode
terminal all semiconductor device diode
silicon all semiconductor device diode
600.0 working peak reverse voltage, peak total value all semiconductor device diode
25.00 amperes forward current, average preset all semiconductor device diode
38.0 watts SMALL-Signal input power, COMMON-Collector preset all semiconductor device diode
terminal junction splice
4 uninsulated wire lead all semiconductor device diode
A grouping of two or more individual semiconductor devices, such as transistors, diodes, and photo semiconductor devices. It includes matched pairs. Excludes absorber, overvoltage; semiconductor device assembly. For interconnected items functioning as power supply rectifiers, see rectifier, semiconductor device.
Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.
Item does not contain precious metal.
No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.
Represents items with no adp components
The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.
PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.
ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.
ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.
CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.