NSN 5961-01-535-2194 NIIN 015352194 — Photo Semiconductor Device

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-01-535-2194
5961015352194
Description:
SEMICONDUCTOR DEVICE,PHOTO
NSN Assigned:
18-NOV-05
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-01-535-2194 Specification Set by the OEM (see RNCC code 3)

Inclosure Material ABBH:

plastic

Overall Length ABHP:

0.180in. and 0.200in. ⁓13/64"

Terminal Length ABJT:

0.500in.

Overall Diameter ADAV:

0.145in. and 0.165in. ⁓11/64"

Mounting Method AXGY:

terminal

Semiconductor Material CTMZ:

gallium arsenide

Voltage Rating In Volts Per Characteristic CTQN:

30.0 breakdown voltage, COLLECTOR-TO-Emitter, base open and 5.0 breakdown voltage, emitter to collector, base open

Current Rating Per Characteristic CTQX:

0.55 microamperes service voltage

Maximum Operating Temp Per Measurement Point CTSG:

100.0 deg celsius ambient air

Part Name Assigned By Controlling Agency CXCY:

infrared selected npn silicon phootransistor

Terminal Type And Quantity TTQY:

2 uninsulated wire lead

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
OP505D
Cage Code:
32694
RNCC:
3
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20587
FIIG:
A110A0
Concept No.:
1
App. Key:
C
Cond. Code:
2
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE,PHOTO"

A semiconductor device (1) which is responsive to visible or infrared radiant energy. May or may not include mounting hardware and/or heat sink. Excludes semiconductor device (1), diode; semiconductor device (1), thyristor and transistor. For solid state devices which emit visible or infrared radiant energy, see light emitting diode.

5961-01-535-2194 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
A
ESD:
A
ESD:
A
ADPE:
0
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.