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silicon
200.0 breakdown voltage, COLLECTOR-TO-Base, emitter open
10.00 milliamperes ZERO-GATE-Voltage source current minor
An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes semiconductor device, diode and semiconductor device, thyristor. For solid state devices which are responsive to visible or infrared radiant energy, see semiconductor device, photo.
Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.
Precious metal content is unknown
No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.
The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.
PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.
ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.
ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.
CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.