NSN 5961-01-254-3839 NIIN 012543839 — Thyristor Semiconductor Device

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NSN

Item Name

Assigned

DEMIL

Shelf Life

UOM

Using Services

NSN:

		5961-01-254-3839
5961012543839

Description:

SEMICONDUCTOR DEVICE,THYRISTOR

NSN Assigned:

05-MAY-87

DEMIL:

DEMIL

Shelf Life:

N/A

UOM:

Using Services:

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Quality Commitment

Serving our customers with quality and safety first.

AS9120 Certified
Audited supply chain
ITAR Registered
DDTC Registered
HAZMAT Certified
Customer service objectives
Every product 100% inspected

5961-01-254-3839 Specification Set by the OEM (see RNCC code 3)

Overall Length ABHP:

2.457in. and 2.627in. ⁓2-41/64"

Mounting Facility Quantity AKPV:

Mounting Method AXGY:

threaded stud

Features Provided CBBL:

hermetically sealed case

Overall Width Across Flats CCDG:

1.052in. and 1.063in.

Nominal Thread Size CQJX:

0.500in. ⁓1/2"

Semiconductor Material CTMZ:

silicon

Voltage Rating In Volts Per Characteristic CTQN:

500.0 repetitive peak OFF-State voltage

Current Rating Per Characteristic CTQX:

110.00 amperes collector current, dc any acceptable

Power Rating Per Characteristic CTRD:

2.0 watts any acceptable universal

Thread Series Designator THSD:

unf

Terminal Type And Quantity TTQY:

1 tab, solder lug

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number

Cage

RNCC

RNVC

DAC

RNAAC

Status

MSDS

SADC

Part Number:

C164E2

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

C164E2X500

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

C164E2

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

C164E2X500

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

C164E2

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

C164E2X500

Cage Code:

03508

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

33096

FIIG:

A110A0

Concept No.:

App. Key:

Cond. Code:

Status:

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE,THYRISTOR"

A bistable semiconductor device comprising three or more junctions which is normally a nonconductor until the application of a signal to a gate terminal, at which time the device switches to the conductive state. Includes devices capable of being switched back to the nonconductive state upon application of a different signal to the same or another gate terminal. May or may not include mounting hardware and/or heatsink. For solid state devices which are responsive to visible or infrared radiant energy, see semiconductor device, photo.

5961-01-254-3839 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC

PMIC

ESD

ENAC

ADPE

CRITL

HMIC:

PMIC:

ESD:

ADPE:

CRITL:

Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) U

Precious metal content is unknown

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.