NSN 5961-01-183-3558 NIIN 011833558 — Thyristor Semiconductor Device

Home » FSG Index » FSG 59 - Electrical And Electronic Equipment Components » FSC 5961 - Semiconductor Devices And Associated Hardware » NSN 5961-01-183-3558
NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-01-183-3558
5961011833558
Description:
SEMICONDUCTOR DEVICE,THYRISTOR
NSN Assigned:
04-JUL-84
DEMIL:
 DEMIL
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-01-183-3558 Specification Set by the OEM (see RNCC code 3)

Overall Length ABHP:

2.637in. ⁓2-41/64"

Terminal Length ABJT:

0.812in.

Mounting Facility Quantity AKPV:

1

Joint Electronic Device Engineering Council/jedec/case Outline Designation ALAZ:

T0-83

Mounting Method AXGY:

threaded stud

Overall Width Across Flats CCDG:

1.047in.

Nominal Thread Size CQJX:

0.500in. ⁓1/2"

Voltage Rating In Volts Per Characteristic CTQN:

100.0 repetitive peak reverse voltage and 1200.0 repetitive peak reverse voltage

Current Rating Per Characteristic CTQX:

125.00 amperes forward current, total rms horsepower metric

Maximum Operating Temp Per Measurement Point CTSG:

125.0 deg celsius junction

Thread Series Designator THSD:

unf

Terminal Type And Quantity TTQY:

2 tab, solder lug and 1 threaded stud

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
82RM100
Cage Code:
59993
RNCC:
3
RNVC:
2
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:
Part Number:
89099927
Cage Code:
F8224
RNCC:
5
RNVC:
2
DAC:
2
RNAAC:
ZF
Status:
A
MSDS:
SADC:
Part Number:
91390257
Cage Code:
F8224
RNCC:
5
RNVC:
2
DAC:
4
RNAAC:
ZF
Status:
A
MSDS:
SADC:
Part Number:
82RM100
Cage Code:
81483
RNCC:
5
RNVC:
9
DAC:
4
RNAAC:
9Z
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
33096
FIIG:
A110A0
Concept No.:
1
App. Key:
D
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE,THYRISTOR"

A bistable semiconductor device comprising three or more junctions which is normally a nonconductor until the application of a signal to a gate terminal, at which time the device switches to the conductive state. Includes devices capable of being switched back to the nonconductive state upon application of a different signal to the same or another gate terminal. May or may not include mounting hardware and/or heatsink. For solid state devices which are responsive to visible or infrared radiant energy, see semiconductor device, photo.

5961-01-183-3558 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
U
ESD:
A
ESD:
A
ADPE:
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) U

Precious metal content is unknown

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.