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4 semiconductor device diode
Two or more discrete semiconductor devices such as diode(s) and/or transistor(s), permanently cased, encapsulated, or potted together to form an inseparable unit. Excludes devices having one or more components other than semiconductor devices. The individually distinct devices forming the unit may be internally connected. The unit in itself does not perform a complete specific function and cannot be assigned a more definite item name. It may include or consist of inseparable matched pairs. May or may not include mounting hardware and/or heatsink. For interconnected items arranged in stack(s), see rectifier, semiconductor device. For items formed on or within a semiconductor material substrate, formed on an insulating substrate or formed on a combination of both of these types, see microcircuit (as modified). Excludes network (as modified); absorber, overvoltage; semiconductor device set; and semiconductor device assembly. Do not use if more specific name applies.
Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.
Item does not contain precious metal.
Represents items with no adp components
The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.
PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.
ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.
ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.
CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.