NSN 5961-00-418-2495 NIIN 004182495 — Semiconductor Device Set

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-00-418-2495
5961004182495
Description:
SEMICONDUCTOR DEVICE SET
NSN Assigned:
20-NOV-70
DEMIL:
NO
Shelf Life:
N/A
UOM:
1 EA
Using Services:
Navy

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-00-418-2495 Specification Set by the OEM (see RNCC code 3)

Inclosure Material ABBH:

glass all semiconductor device diode

Overall Length ABHP:

0.230in. all semiconductor device diode and 0.300in. all semiconductor device diode ⁓5/16"

Terminal Length ABJT:

1.000in. all semiconductor device diode

Overall Diameter ADAV:

0.085in. all semiconductor device diode and 0.107in. all semiconductor device diode ⁓7/64"

Internal Configuration ALAS:

junction contact all semiconductor device diode

Joint Electronic Device Engineering Council/jedec/case Outline Designation ALAZ:

DO-7 all semiconductor device diode

Internal Junction Configuration ASCQ:

pn all semiconductor device diode

Component Function Relationship ASDD:

matched

Component Name And Quantity ASKA:

9 semiconductor device diode

Mounting Method AXGY:

terminal all semiconductor device diode

Features Provided CBBL:

gold plated leads and hermetically sealed case

Semiconductor Material CTMZ:

silicon all semiconductor device diode

Voltage Rating In Volts Per Characteristic CTQN:

50.0 working peak reverse voltage all semiconductor device diode

Current Rating Per Characteristic CTQX:

150.00 milliamperes forward current, average absolute all semiconductor device diode

Power Rating Per Characteristic CTRD:

500.0 milliwatts SMALL-Signal input power, COMMON-Collector preset all semiconductor device diode

Maximum Operating Temp Per Measurement Point CTSG:

150.0 deg celsius junction all semiconductor device diode

Precious Material And Location PMLC:

terminal surfaces gold

Precious Material PRMT:

gold

Terminal Type And Quantity TTQY:

2 uninsulated wire lead all semiconductor device diode

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
361473-1
Cage Code:
00752
RNCC:
3
RNVC:
2
DAC:
5
RNAAC:
KE
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20590
FIIG:
A110A0
Concept No.:
App. Key:
F
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE SET"

A grouping of two or more individual semiconductor devices, such as transistors, diodes, and photo semiconductor devices. It includes matched pairs. Excludes absorber, overvoltage; semiconductor device assembly. For interconnected items functioning as power supply rectifiers, see rectifier, semiconductor device.

Packaging & Dimensions Packaging instructions, special markings, and approx. weight/dims

Pack Size
Pack Weight
Item Weight
Item Dim.
Pack Size:
--
Paclk Weight:
0.0000lbs
Item Weight:
--
Item Dim:
--
Container
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
LVL C
Container:
--
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
ZZ
LVL_A:
Q
LVL_B:
Q
LVL_C:
6
LVL A Code (LVL_A) Q

Packing shall be accomplished in accordance with table c.ii for the packing level specified. closure, sealing and reinforcement shall be in accordance with applicable specification for shipping container.

LVL B Code (LVL_B) Q

Packing shall be accomplished in accordance with table c.ii for the packing level specified. closure, sealing and reinforcement shall be in accordance with the appropriate shipping container specification.

LVL C Code (LVL_C) 6

Packing shall be accomplished to meet the performance test requirements of astm-d4169, distribution cycle 18, assurance level 3.

Procedure Indicator Code (OPI) O

Options can be exercised as to specific method of preservation or dod approved packaging materials to be used. however, basic preservation method shall be retained, supplemental data shall be complied with, and unit package dimensions shall not be increased by more than one inch. equal or better protection shall be given the item and there shall be no increase in the package cost.

Special Markings Code (SPC_MKG) ZZ

Special requirements.

  Packaging Codes

OPI: Optional Procedure Indicator Code. A one position alpha code that indicates the allowable deviations from the prescribed requirements.

SPI No.: Special packaging instructions number.

LVL A/B/C: Indicates the type of shipping container required for level A, B, or C maximum packing protection.

SPC Mkg: A two position code that identifies the special markings applied to the container, which is part of the total pack to protect the contained item during preservation, packing, storage, transit and removal from the pack.

5961-00-418-2495 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
G
ESD:
ESD:
ADPE:
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) G

Item contains gold.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.