NSN 5961-00-408-4586 NIIN 004084586 — Diode Semiconductor Device

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-00-408-4586
5961004084586
Description:
SEMICONDUCTOR DEVICE,DIODE
NSN Assigned:
25-JAN-72
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-00-408-4586 Specification Set by the OEM (see RNCC code 3)

Inclosure Material ABBH:

metal

Overall Length ABHP:

0.450in. ⁓29/64"

Overall Diameter ADAV:

0.667in. ⁓43/64"

Mounting Facility Quantity AKPV:

1

Mounting Method AXGY:

threaded stud

Features Provided CBBL:

hermetically sealed case

Overall Width Across Flats CCDG:

0.667in. and 0.687in.

Nominal Thread Size CQJX:

0.250in. ⁓1/4"

Semiconductor Material CTMZ:

silicon

Voltage Rating In Volts Per Characteristic CTQN:

31.5 breakdown voltage, dc

Current Rating Per Characteristic CTQX:

3190.00 milliamperes repetitive peak forward current

Power Rating Per Characteristic CTRD:

50.0 watts SMALL-Signal input power, COMMON-Collector preset

Maximum Operating Temp Per Measurement Point CTSG:

150.0 deg celsius case

Test Data Document TEST:

81349-MIL-S-19500 specification (includes engineering type bulletins, brochures, etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type data on certain environmental and performance requirements and test conditions that are shown as "typical", "average", "", etc.) .

Thread Series Designator THSD:

unf

Terminal Type And Quantity TTQY:

1 threaded stud and 1 tab, solder lug

Specification/standard Data ZZZK:

81349-MIL-S-19500/358 government specification

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
JAN1N3324RB
Cage Code:
81349
RNCC:
2
RNVC:
2
DAC:
3
RNAAC:
TX
Status:
A
MSDS:
SADC:
Part Number:
MILS19500-358
Cage Code:
81349
RNCC:
4
RNVC:
1
DAC:
3
RNAAC:
TX
Status:
A
MSDS:
SADC:
Part Number:
1N3324RB
Cage Code:
04713
RNCC:
C
RNVC:
1
DAC:
3
RNAAC:
TX
Status:
A
MSDS:
SADC:
Part Number:
1N3324RB
Cage Code:
12954
RNCC:
C
RNVC:
1
DAC:
3
RNAAC:
TX
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20589
FIIG:
A110A0
Concept No.:
1
App. Key:
B
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE,DIODE"

A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes light emitting diode and semiconductor device,photo. For items containing material such as selenium and copper oxide, see recifier, metallic.

5961-00-408-4586 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
ADPE:
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.