NSN 5961-00-406-8724 NIIN 004068724 — Unitized Semiconductor Devices

NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-00-406-8724
5961004068724
Description:
SEMICONDUCTOR DEVICES,UNITIZED
NSN Assigned:
17-APR-70
DEMIL:
NO
Shelf Life:
N/A
UOM:
--
Using Services:
--

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Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-00-406-8724 Specification Set by the OEM (see RNCC code 3)

Inclosure Material ABBH:

plastic

Overall Length ABHP:

0.180in. ⁓3/16"

Terminal Length ABJT:

1.500in.

Overall Diameter ADAV:

0.370in. ⁓3/8"

Component Name And Quantity ASKA:

2 transistor

Mounting Method AXGY:

terminal

Terminal Circle Diameter AYQS:

0.200in.

Semiconductor Material CTMZ:

silicon all transistor

Voltage Rating In Volts Per Characteristic CTQN:

60.0 breakdown voltage, COLLECTOR-TO-Base, emitter open all transistor

Power Rating Per Characteristic CTRD:

600.0 milliwatts SMALL-Signal input power, COMMON-Emitter absolute all transistor

Special Features FEAT:

internal junction configuration transistor pnp

Terminal Type And Quantity TTQY:

6 uninsulated wire lead

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
534737-1
Cage Code:
96214
RNCC:
3
RNVC:
2
DAC:
1
RNAAC:
TX
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
61962
FIIG:
A110A0
Concept No.:
App. Key:
E
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICES,UNITIZED"

Two or more discrete semiconductor devices such as diode(s) and/or transistor(s), permanently cased, encapsulated, or potted together to form an inseparable unit. Excludes devices having one or more components other than semiconductor devices. The individually distinct devices forming the unit may be internally connected. The unit in itself does not perform a complete specific function and cannot be assigned a more definite item name. It may include or consist of inseparable matched pairs. May or may not include mounting hardware and/or heatsink. For interconnected items arranged in stack(s), see rectifier, semiconductor device. For items formed on or within a semiconductor material substrate, formed on an insulating substrate or formed on a combination of both of these types, see microcircuit (as modified). Excludes network (as modified); absorber, overvoltage; semiconductor device set; and semiconductor device assembly. Do not use if more specific name applies.

5961-00-406-8724 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
A
ESD:
A
ESD:
A
ADPE:
0
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Electrostatic Discharge (ESD) A

No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.