NSN 5961-00-016-4951 NIIN 000164951 — Semiconductor Device Set

Home » FSG Index » FSG 59 - Electrical And Electronic Equipment Components » FSC 5961 - Semiconductor Devices And Associated Hardware » NSN 5961-00-016-4951
NSN
Item Name
Assigned
DEMIL
Shelf Life
UOM
Using Services
NSN:
5961-00-016-4951
5961000164951
Description:
SEMICONDUCTOR DEVICE SET
NSN Assigned:
25-APR-67
DEMIL:
NO
Shelf Life:
N/A
UOM:
1 PR
Using Services:
Navy

Price Quote Get an up to date pricing and availability quote for this product. Order online or over the phone.

Part Number:
Quantity Requested:
Your Email:
Full Name:
Contact Phone:
Company:

Quality Commitment

Serving our customers with quality and safety first.

  •   AS9120 Certified
  •   Audited supply chain
  •   ITAR Registered
  •   DDTC Registered
  •   HAZMAT Certified
  •   Customer service objectives
  •   Every product 100% inspected
AS9120 Certified by SAI Global

5961-00-016-4951 Specification Set by the OEM (see RNCC code 3)

Inclosure Material ABBH:

glass all semiconductor device diode

Overall Length ABHP:

0.230in. all semiconductor device diode and 0.300in. all semiconductor device diode ⁓5/16"

Terminal Length ABJT:

1.000in. all semiconductor device diode

Overall Diameter ADAV:

0.108in. all semiconductor device diode and 0.140in. all semiconductor device diode ⁓9/64"

Internal Configuration ALAS:

junction contact all semiconductor device diode

Joint Electronic Device Engineering Council/jedec/case Outline Designation ALAZ:

DO-14 all semiconductor device diode

Internal Junction Configuration ASCQ:

pn all semiconductor device diode

Component Function Relationship ASDD:

matched

Component Name And Quantity ASKA:

2 semiconductor device diode

Mounting Method AXGY:

terminal all semiconductor device diode

Semiconductor Material CTMZ:

silicon all semiconductor device diode

Voltage Rating In Volts Per Characteristic CTQN:

225.0 repetitive peak reverse voltage all semiconductor device diode

Current Rating Per Characteristic CTQX:

15.00 amperes peak forward surge current and 400.00 milliamperes forward current, average absolute all semiconductor device diode

Terminal Type And Quantity TTQY:

2 uninsulated wire lead all semiconductor device diode

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number
Cage
RNCC
RNVC
DAC
RNAAC
Status
MSDS
SADC
Part Number:
2553316
Cage Code:
10001
RNCC:
3
RNVC:
2
DAC:
1
RNAAC:
HD
Status:
A
MSDS:
SADC:

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
20590
FIIG:
A110A0
Concept No.:
App. Key:
F
Cond. Code:
1
Status:
A

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE SET"

A grouping of two or more individual semiconductor devices, such as transistors, diodes, and photo semiconductor devices. It includes matched pairs. Excludes absorber, overvoltage; semiconductor device assembly. For interconnected items functioning as power supply rectifiers, see rectifier, semiconductor device.

5961-00-016-4951 Material Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC
PMIC
ESD
ENAC
ADPE
CRITL
HMIC:
N
PMIC:
U
ESD:
ESD:
ADPE:
CRITL:
X
Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) U

Precious metal content is unknown

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

  Identification Codes

HMIC: Hazardous Material Indicator Code. A one position code that identifies a hazardous item.

PMIC: Precious Metal Indicator Code. A one position code which identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.