NSN 6625-00-087-2973 NIIN — Semiconductor Device Test Set

National Stock number : 6625-00-087-2973

Semiconductor Device Test Set


Available Quantity 239
Available Conditions NS NE SV OH AR
Classification Electrical and Electronic Properties Measuring and Testing Instruments - FSC 6625
Schedule B 9030908030
Stock Check Date 07/26/2025
Part-Number.info Quality System
  •   ISO 9001:2015 + AS9120B Certifed
  •   Audited supply chain
  •   Counterfeit Parts Prevention
  •   100% Product Inspections
  •   7 Year Record Retention
  •   HAZMAT Certified
  •   ITAR and DDTC Registered
AS9120 Certified Supplier

Product Properties


Description

Semiconductor Device Test Set

Width

250.0 mm

Ac Voltage Rating

115.0 volts

Frequency Rating

60.0 hertz

Depth

286.0 mm

End Item Identification

nsn 5826-00-117-7747 calibration bench mock up

Electrical Power Source Relationship

operating

Inclosure Feature

single item w/housing

Test Type For Which Designed

IN-Circuit testing of components

Phase

single

Height

86.0 mm

Reference Data And Literature

to 33A1-15-55-4

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National Stock Number
6625-00-087-2973
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